MI-SIM Pro+

Super-Resolution Imaging Super-Resolution Imaging

MI-SIM Pro+ is an advanced structured illumination microscopy platform for demanding live-cell and multi-dimensional imaging experiments. The system provides resolution down to 60 nm in X–Y and combines 2D, 3D and TIRF-SIM imaging with advanced software functions for sample overview, multi-position acquisition, intelligent tracking and event-based imaging.

Its high sensitivity allows researchers to capture rapid subcellular dynamics while reducing photobleaching and phototoxicity, making the system suitable for both fast acquisition and extended observation of living samples.

Features

Resolution down to 60 nm in X–Y and 200 nm in Z
2D, 3D and TIRF structured illumination microscopy
More than 300 reconstructed frames per second
Real-time super-resolution reconstruction and preview
Multi-position and multi-modal imaging
Large-field image acquisition and stitching
Intelligent cell and object tracking
AI-based object recognition
Event-based triggering and feedback microscopy
Advanced reconstruction using Hessian SIM and SPARSE deconvolution
Integrated acquisition, reconstruction and analysis software
Standard TIF output compatible with third-party analysis software

Technology

Super-Resolution Imaging

Super-resolution imaging includes advanced microscopy techniques that overcome the diffraction limit of conventional light microscopy. While standard optical microscopes typically cannot distinguish structures closer than approximately 200 nm, super-resolut...
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